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http://dx.doi.org/10.1201/9781420040845
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Table Of ContentsAbstract - Hi-Res PDF (142 KB) - PDF w/links (148 KB)
Chapter 1. Reliability ScienceAbstract - Hi-Res PDF (136 KB) - PDF w/links (137 KB)
Chapter 2. Understanding Customer RequirementsAbstract - Hi-Res PDF (86 KB) - PDF w/links (87 KB)
Chapter 3. Design Assessment Reliability TestingAbstract - Hi-Res PDF (85 KB) - PDF w/links (86 KB)
Chapter 4. Design Maturity Testing (DMT)Abstract - Hi-Res PDF (142 KB) - PDF w/links (153 KB)
Chapter 5. Screening and MonitoringAbstract - Hi-Res PDF (97 KB) - PDF w/links (97 KB)
Chapter 6. Semiconductor Process ReliabilityAbstract - Hi-Res PDF (562 KB) - PDF w/links (310 KB)
Chapter 7. Analytical PhysicsAbstract - Hi-Res PDF (1820 KB) - PDF w/links (1082 KB)
Chapter 8. Reliability Statistics SimplifiedAbstract - Hi-Res PDF (639 KB) - PDF w/links (551 KB)
Chapter 9. Concepts in Accelerated TestingAbstract - Hi-Res PDF (761 KB) - PDF w/links (425 KB)
Chapter 10. Accelerated Reliability GrowthAbstract - Hi-Res PDF (217 KB) - PDF w/links (233 KB)
Chapter 11. Reliability Predictive ModelingAbstract - Hi-Res PDF (216 KB) - PDF w/links (246 KB)
Chapter 12. Failure Modes and Effects AnalysisAbstract - Hi-Res PDF (147 KB) - PDF w/links (147 KB)
Chapter 13. Evaluating Product RisksAbstract - Hi-Res PDF (136 KB) - PDF w/links (137 KB)
Chapter 14. Thermodynamic Reliability EngineeringAbstract - Hi-Res PDF (670 KB) - PDF w/links (610 KB)
