ABSTRACT

"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."

chapter X|94 pages

X-ray Physics

chapter 4|102 pages

Spectrum Evaluation

chapter 11|88 pages

Microbeam XRF