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http://dx.doi.org/10.1201/9781420034196
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Front MatterAbstract - Hi-Res PDF (347 KB) - PDF w/links (348 KB)
Chapter 1. General philosophy of measurementAbstract - Hi-Res PDF (434 KB) - PDF w/links (435 KB)
Chapter 2. Surface characterizationAbstract - Hi-Res PDF (7978 KB) - PDF w/links (7263 KB)
Chapter 3. ProcessingAbstract - Hi-Res PDF (3298 KB) - PDF w/links (3209 KB)
Chapter 4. InstrumentationAbstract - Hi-Res PDF (10333 KB) - PDF w/links (9952 KB)
Chapter 5. Traceability—standardization—variabilityAbstract - Hi-Res PDF (6966 KB) - PDF w/links (6133 KB)
Chapter 6. Surface metrology in manufactureAbstract - Hi-Res PDF (7869 KB) - PDF w/links (7151 KB)
Chapter 7. Surface geometry and its importance in functionAbstract - Hi-Res PDF (7548 KB) - PDF w/links (7454 KB)
Chapter 8. NanometrologyAbstract - Hi-Res PDF (2861 KB) - PDF w/links (2816 KB)
Chapter 9. Summary and conclusionsAbstract - Hi-Res PDF (1402 KB) - PDF w/links (1390 KB)
GlossaryAbstract - Hi-Res PDF (350 KB) - PDF w/links (351 KB)
